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Issue Date Title Author(s) Journal View
2012-01-09
Intrinsic parameter extraction of a-InGaZnO thin-film transistors by a gated-four-probe method

Jeong, J[Jeong, Jaewook] ;  Kim, J[Kim, Joonwoo] ;  Lee, GJ[Lee, Gwang Jun] ;  Choi, BD[Choi, Byeong-Dae]

American Institute of Physics Publishing, 2012-01-09

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